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Conference ricks::dechips

Title:Hudson VLSI
Notice:For Digital Chip Data - CHIPBZ::PRODUCTION$:[DS_INFO...]
Moderator:RICKS::PHIPPS
Created:Wed Feb 12 1986
Last Modified:Fri Jun 06 1997
Last Successful Update:Fri Jun 06 1997
Number of topics:701
Total number of notes:4658

186.0. "Image Analysis in QC testing?" by ESOA11::BRAMHALL () Mon Feb 22 1993 09:50

T.RTitleUserPersonal
Name
DateLines
186.1Contact infoRICKS::BURNSWed Feb 24 1993 15:0611
186.2Image analysis used to capture defectsYIELD::GERTZISTue May 04 1993 12:375